Echelle Spectra Analyzer ESA رایمند سیستم آزما <

Echelle Spectra Analyzer ESA

Compact Echelle Spectrometer with extraordinary high spectral resolution for different applications in atomic spectroscopy, for active and passive coupling with different radiation sources.

Echelle Spectra Analyzer ESA 3000, Electronic and optical module
Echelle Spectra Analyzer ESA 3000, Electronic and optical module

 

 

Functionality

The Echelle Spectra Analyzer ESA 3000 was developed for measurements of complex spectra with a high spectral resolution. The entire UV and visible wavelength range is detected simultaneously with a resolution of few pm.
ESA 3000 is used in atomic spectroscopy, detecting simultaneously all spectral lines with high resolution, relevant for analysis of material, avoiding the overlay of lines. The optional use of an image intensifier permits time-resolved measurement (decay measurements)with a temporal resolution of few nanoseconds. The control of external radiation sources , e.g. laser, and the well-defined time-correlated measurement of the radiation predestines ESA 3000 for Laser Induced Breakdown Spectroscopy (kurz LIBS), for applications for simultaneously multi-element analysis.

The system consist of an Echelle spectrometer aand the electronic control unit. The electronic unit contains the voltage supplies, the ADC, framegrabber and fastpulse generator board besides the industrial PC, all located in a 19" rack. The fastpulse generator board is able to perform the time-control of the entire experiment or to synchronize the system to an external signal.

Inside the spectrometer an intensified CCD-camera is integrated, consisting of an image intensifier and CCD sensor array of high pixel density. The camera is placed in the image plane of the spectrometer. The MCP (Micro Channel Plate)-image intensifier is controlled (open-close) by electric signals and permits the time-resolved measurment of weak signals respectively of dynamic processes.

The time-resolved simultaneous detection of the entire relevant wavelength range permits the optimalö selection of spectral lines according to the application and an optimization of the S/N ratio.

For fast spectra processing non-relevant spectral can be summarized and discarded at an early stage of data processing. A bit pattern,stored in a memory (RAM) provides an orientation for the summarization of selected lines on the detector array.(Line-Binning). During read-out of lines selected parts of a line can be summarized (Column-Binning). Using the binning feature the spectra processing can be accelerated up to one order of magnitude.

Offered as an OEM-version, ESA 3000 is easy to integrate into existing systems and plants. The patented optical setup does not have any moving parts. The compact construction guarantees a high stability of the wavelength calibration and proves the industrial use of the device.
 


Optical Setup

 

Optical setup of the Echelle Spectrometer
Optical Setup

An Echelle grating, which is positioned under a flat angle of incidence, produces up to 100 diffraction orders. An additional quartz prism in front of the grating separates the overlapping orders by splitting them vertically to the direction of the spectrum. In that way the compact spectrograph covers a total spectrum length of over one meter on a one square inch focal plane. The optical parameters of the entire setup fit the relevant spectral range to the sensitive range of the camera of 25 mm x 25 mm. The linear dispersion is fitted to the pixel size of the camera.
 


Echelle Spectra(entire camera picture)

 

Echelle Spectra (entire camera picture)              Echelle Spectra (entire camera picture)

Wavelength spectrum, calculated from the Echelle picture; Cr-line group at 285 nm

CN-molecul spectrum with cyanband head at 388.34nm

Wavelength spectrum, calculated from the Echelle picture; Cr-line group at 285 nm

CN-CN-molecul spectrum with cyanband head at 388.34nm

 

For system control and data processing a control and analytical software featuring various analytical tools is provided (see software ESAWIN).


The following pictures provide a first impression on the different possibilities for data visualization.

Visualization of data

Spectra visualization of a steel sample, upper left camera picture, upper right selection of particular lines, lower spectrum sector
Spectra visualization of a steel sample, upper left camera picture, upper right selection of particular lines, lower spectrum sector

 

	Wavelength respectively element analysis program  Echelle recording of a tool steel
Wavelength respectively element analysis program Echelle recording of a tool steel

 

Technical specification

 

Echelle Spectrometer

Standard version 3000 EV/i

UV-Version 3000 EV/i

Spectral range for simultaneous detection

200 - 780 nm

190 - 400 nm

Linear dispersion per pixel (24 m)

0.005 nm at 200 nm
0.015 nm at 600 nm

0.0027 nm at 190 nm
0.0051 nm at 350 nm

Spectral resolution(l/Dl) FWHM

20000

30000

Spectral orders

30 - 120

110 - 205

Focal length

25 cm

Image plane

25 x 25 mm

Dimensions

300 x 200 x 500 mm

Weight

13,5 kg

Option

Fiber optical input, water-cooling unit

ICCD-camera:

Kodak KAF-1001 (1024x1024 pixels);
dark current 25 pA/cm2 at 20C;
saturation charge 500.000 electrons
with gateable image intensifier(MCP); temporal resolution approximately 20 ns; on-chip-integration time up to 3 min, double correlated sampling, stabilization of temperature, closed water-cooling circuit.

New!!

Now avaible with
Back-thinned CCD-camera:

Hamamatsu S7171 (512 x 512 pixles);
dark current 110 pA/cm2 at 25C;
saturation charge 300.000 electrons;
one-stage TE-cooled;
closed water-cooling circuit;
enabled spectral range detection up to 1100 nm

Electronic unit

Fast-pulse-generator:

Control of image intensifier of ICCD camera, open time adjustable 20 ns - 6 ms; control of pulsed radiation surces (laser)and synchronization with external trigger signal (master- and slave mode - 2 TTL-signal outputs);programmable TTL-pulse generation ; Cw-option permits measurement of long-time plasma
 

Controller:

Prozessor AMD K6-3, 550 MHz; hard disk min. 20 GB; 128 MB RAM, CDRW-burner, 2 MB Video-RAM with 16 Bit ADC / 500 (1000) kHz conversion rate, WINDOWS 2000; keyboard

Interfaces:

serial RS-232, Ethernet, USB, VGA-monitor, printer, I/O-ports for process control

Voltage supply:

230 V, 4 A, 50 / 60 Hz (optional 110/120 V, 60 Hz)

 

Software

Control and analytical software ESAWIN

  • Dialog controlled operation, on-line help
  • Setting of measuring parameter, Method-specific control of the measurement (start, stop with time r pulse selection, manual stop, externally triggered)
  • Selection of spectra display, line selection, display of line groups of detected elements
  • Automatic qualitative multi-element-analysis
  • Setting of output parameters
  • Data storage (Archive functions, use of standard and atom database, data import and export)
  • Calibration according to different models for quantitative multi-element-analysis using calibration samples, calculation of concentration
  • Special tools for LIBS-measurements
  • Plasma temperature calculation


ESAWIN-Temperature module:

This modul permits the determination of the excitation temperatures of different atomes and ions in plasma using the Boltzmann-Plot-Method. The excitation conditions may vary between the singular laser pulses due to the interactions between laser and sample surface, performing LIBS measurements. The meaurement of the laser power characterizes the energy provided by the laser, but the energy used for the creation of the plasma is not determined. The plasma temperature can be used as an additional criterion for the description of the stability of the excitation parameters. Depending on the matrix and the measuring parameters the excitation temperatures of different atoms and ions may vary.



The T-module is provded as dll-file t_module.dll. Additionally, spectral line data are provided as text files for almost al elements. The data represent an extract from the Kurucz-23-line data (online version of Kurucz-database: 1995 Atomic Line Data (R.L. Kurucz and B. Bell) Kurucz CD-ROM No.23, Cambridge, Mass.: Smithsonian Astrophysical Observatory). They fit the ROI-Files of LLA.

 


 
Demo software

The new demo version of ESAWIN software (Version 3.12) is available on CD. Order your copy free of charge here and do not forget your mail address. ESAWIN is used for control of measurement and spectra processing at ESA 3000 and LIPAN.

  

 


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